Science
Measurements of specular reflectivity give information about structure perpendicular to a surface interface, but an increasing number of important science and technology issues in the study of thin films, multilayers and interfaces concern structure in the plane of the interface.
Techniques
- Reflectometry
- Spin-Echo SANS
- Spin-Echo Resolved Grazing Incidence Scattering (SERGIS)
Technical
Offspec can perform a variety of different measurements:
- Neutron Reflection (NR).
- Polarised neutron reflection with polarisation analysis (PNR)
- Spin-Echo Resolved Grazing Incidence Scattering (SERGIS)
- Spin-Echo Small Angle Neutron Scattering (SESANS)
- High angular resolution neutron reflection
- Neutron Reflection from macroscopically curved surfaces
- Quasi-Elastic Neutron Spin-Echo (Over a very limited dynamic range)
Contact information for Offspec instrument
Location and contact information for the Offspec beamline
Access | Restricted |
Building | R80 - EXPERIMENTAL HALL 2 |
Telephone | 01235 567045
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