Such measurements underpin much of our understanding of complex bulk magnetic structures. This is equally true for thin film magnetism. However, this has not been significantly exploited experimentally and typically only 2 or 4 of the 9 spin dependent cross-sections are measured. To address this issue we can now provide a 2T three dimensional magnet which will allow the application of a magnetic field in any direction. Coupled with controllable incident polarisation this will allow access to the full elements of the polarisation matrix and the information therein.
This magnet is used on reflectometery experiments.
If you have any questions about this equipment or you think you may want to use one on your experiment contact the sample environment team, or the respective instrument scientist.
System feature
|
Specification
|
Usable sample space |
Ø 70 mm |
Maximum sample length below centreline |
39 mm |
Clear window access in beam direction: - VTI - Shield - OVC |
Ø 34 mm Ø 59 mm Ø 66 mm |
Clear window access in transverse direction: - VTI - Shield - OVC |
Ø 10 mm Ø 34 mm Ø 21 mm |