Bruker Veeco Dimension 3100
01 Mar 2020
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​​​The Bruker Veeco Dimension 3100 Atomic Force Microscope in the Materials Characterisation Laboratory​

 

​Overview

Scanning probe microscopy measurements can be done at ISIS using the Dimension 3100, housed in the Materials Characterisation Laboratory. The instrument will accept a variety of samples such as semiconductor wafers, lithography masks and magnetic media.​


Common Research Applications

  • Topography of surfaces

  • Properties of surfaces

  • Properties of single molecules

  • Forces within molecules​

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Specifications

  • Measures sample sizes of 150 mm diameter and 12 mm thickness

  • Stage movement in xy of 150 mm with 2 μm resolution

  • Video optics with zoom 150 – 675 μm viewing area

  • Piezo scan head range of 90 μm in xy and 6 μm in z

  • Sub nanometre resolution

  • Maximum 512 × 512 samples/image​


Measurement Package

The instrument is typically used for Tapping Mode atomic force microscopy imaging, however with a simple magnetisation of the probe tip and changing some software settings, magnetic force microscopy measurements are possible as well. With this mode you can map magnetic force gradients and features at the sample surface, as well as a physical height scan simultaneously.​


Measurement Options​

  • AFM-Tapping

  • Magnetic Force Microscopy

  • Conductive-AFM

  • Liquid Cell-AFM

​Dimension 3100 Brochure

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