REGISTER HERE
Register your interest for the workshop; this event is STFC supported and there are no registration fees. For further details contact Paolo Rech or Chris Frost
With self driving cars imminently about to arrive in the global market questions are arising regarding the reliability of component devices and systems and their ability to deal with the threat posed by the natural background radiation
This short (2-day) workshop aims at putting together experts from academia, automotive sector, and chip designers working from transistor-level to system and application-level reliability
Our goal is to stimulate the discussion and create connections to evaluate this key reliability issue and look towards novel solutions to mitigate faults effects in automotive and other similar critical autonomous applications
Topics Covered
Natural radiation threat
Basic Mechanisms
Accelerators (GPU, FPGA, Edge AI, ...)
Components (power transistors, sensors)
Applications (neural networks, image processing, decision making)
Hardening Solutions (HW/SW replicas, checkpoint, detection, transistor hardening)
Standards and Measurements (ISO, FIT, beam and fault-injection, errors criticality)
Provisional programme:
Workshop Programme 2022.pdf
Tour of ISIS - there will be an opportunity for in-person attendeesto visit the ChipIr and new NILE neutron radiation facilitiesRound table - a round table will be organized to discuss possible collaborations and how to advance the knowledge on reliability for self-driving cars
Workshop dinner
Contact