Overview
The instrument collects a high resolution X-ray diffraction pattern from the single crystal out of which the right crystallographic plane cut can be selected with excellent accuracy. It allows real-time crystal orientation down to 0.1 degrees accuracy. The system delivers an intense X-ray beam with less than 0.3 mm on sample.
Common Research Applications
Specifications
< 200 μm beam size
High brilliance X-ray generator
Motorised/manual goniometer and high precision stages
Video sample positioning/viewing camera
Detector: selectable exposure from 1 ms to minutes, automatic background subtraction mode, 16-bit high precision acquisition mode, 12-bit fast preview mode
Software
The Laue image alignment software automatically detects diffraction spots and calculates spot position against a reference crystal. It also allows automatic calculation of mis orientation against goniometer and crystallographic axis and therefore does not require manual fits of distorted patterns.
Manufacturer's brochure
